MMDF2C03HD
di/dt = 300 A/ m s
Standard Cell Density
t rr
High Cell Density
t a
t rr
t b
t, TIME
Figure 11. Reverse Recovery Time (t rr )
SAFE OPERATING AREA
The Forward Biased Safe Operating Area curves define
the maximum simultaneous drain ? to ? source voltage and
drain current that a transistor can handle safely when it is
forward biased. Curves are based upon maximum peak
junction temperature and a case temperature (T C ) of 25 ° C.
Peak repetitive pulsed power limits are determined by using
the thermal response data in conjunction with the procedures
discussed in AN569, “Transient Thermal Resistance ?
General Data and Its Use.”
Switching between the off ? state and the on ? state may
traverse any load line provided neither rated peak current
(I DM ) nor rated voltage (V DSS ) is exceeded, and that the
transition time (t r , t f ) does not exceed 10 m s. In addition the
total power averaged over a complete switching cycle must
not exceed (T J(MAX) ? T C )/(R q JC ).
A power MOSFET designated E ? FET can be safely used
in switching circuits with unclamped inductive loads. For
N ? Channel
reliable operation, the stored energy from circuit inductance
dissipated in the transistor while in avalanche must be less
than the rated limit and must be adjusted for operating
conditions differing from those specified. Although industry
practice is to rate in terms of energy, avalanche energy
capability is not a constant. The energy rating decreases
non ? linearly with an increase of peak current in avalanche
and peak junction temperature.
Although many E ? FETs can withstand the stress of
drain ? to ? source avalanche at currents up to rated pulsed
current (I DM ), the energy rating is specified at rated
continuous current (I D ), in accordance with industry
custom. The energy rating must be derated for temperature
as shown in the accompanying graph (Figure 13). Maximum
energy at currents below rated continuous I D can safely be
assumed to equal the values indicated.
P ? Channel
100
10
V GS = 20 V
SINGLE PULSE
T C = 25 ° C
10 ms
1 ms
10 m s
100 m s
100
10
V GS = 20 V
SINGLE PULSE
T C = 25 ° C
Mounted on 2 ″ sq. FR4 board (1 ″ sq. 2 oz. Cu 0.06 ″
thick single sided) with one die operating, 10s max.
100 m s
1 ms
10 ms
1
dc
1
dc
R DS(on) LIMIT
0.1
0.01
THERMAL LIMIT
PACKAGE LIMIT
Mounted on 2 ″ sq. FR4 board (1 ″ sq. 2 oz. Cu 0.06 ″
thick single sided) with one die operating, 10s max.
0.1
0.01
R DS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT
0.1
1
10
100
0.1
1
10
100
V DS , DRAIN-TO-SOURCE VOLTAGE (VOLTS)
Figure 12. Maximum Rated Forward Biased
Safe Operating Area
http://onsemi.com
8
V DS , DRAIN-TO-SOURCE VOLTAGE (VOLTS)
Figure 12. Maximum Rated Forward Biased
Safe Operating Area
相关PDF资料
MMDF2N02ER2G MOSFET N-CHAN DUAL 2A 25V 8SOIC
MMDF2P02ER2G MOSFET PWR P-CH 25V 2.5A 8-SOIC
MMDF2P02HDR2G MOSFET P-CH DUAL 3.3A 20V 8SOIC
MMDF3N02HDR2G MOSFET PWR P-CH 20V 3.8A 8-SOIC
MMDF3N04HDR2G MOSFET N-CH DUAL 3.4A 40V 8SOIC
MMDFS6N303R2 MOSFET N-CH 30V 6A 8-SOIC
MMFT5P03HDT1 MOSFET P-CH 30V 3.7A SOT223
MMFT960T1 MOSFET N-CH 60V 300MA SOT223
相关代理商/技术参数
MMDF2C03HDR2G 制造商:ON Semiconductor 功能描述:MOSFET
MMDF2N02E 制造商:ONSEMI 制造商全称:ON Semiconductor 功能描述:Power MOSFET 2 Amps, 25 Volts N−Channel SO−8, Dual
MMDF2N02ER2 功能描述:MOSFET 25V 2A N-Channel RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS(导通):0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube
MMDF2N02ER2G 功能描述:MOSFET NFET SO8D 25V 3.6A 100mOhm RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS(导通):0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube
MMDF2N05ZR2 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Motorola Inc 功能描述: 制造商:ON Semiconductor 功能描述:
MMDF2N06V 制造商:MOTOROLA 制造商全称:Motorola, Inc 功能描述:DUAL TMOS MOSFET 3.3 AMPERES 60 VOLTS
MMDF2N06VL 制造商:MOTOROLA 制造商全称:Motorola, Inc 功能描述:DUAL TMOS MOSFET 2.5 AMPERES 60 VOLTS
MMDF2P01HD 制造商:MOTOROLA 制造商全称:Motorola, Inc 功能描述:DUAL TMOS POWER FET 2.0 AMPERES 12 VOLTS